ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Altro …
Indigo.ca new in stock. Costi di spedizione:zzgl. Versandkosten., Costi di spedizione aggiuntivi Details... |
Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - copertina rigida, flessible
2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… Altro …
booklooker.de |
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Altro …
Springer.com Nr. 978-1-4419-0930-5. Costi di spedizione:Worldwide free shipping, , DE. (EUR 0.00) Details... |
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - Prima edizione
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… Altro …
buchfreund.de Buchpark GmbH, 14959 Trebbin Costi di spedizione:Versandkostenfrei innerhalb der BRD. (EUR 0.00) Details... |
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - Prima edizione
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … Altro …
booklooker.de |
Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters - nuovo libro
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Altro …
Garg, Rajesh:
Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - copertina rigida, flessible2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… Altro …
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Altro …
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - Prima edizione
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… Altro …
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - Prima edizione
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … Altro …
Dati bibliografici del miglior libro corrispondente
Autore: | |
Titolo: | |
ISBN: |
Informazioni dettagliate del libro - Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters
EAN (ISBN-13): 9781441909305
ISBN (ISBN-10): 1441909303
Copertina rigida
Anno di pubblicazione: 2009
Editore: Rajesh Garg
212 Pagine
Peso: 0,501 kg
Lingua: eng/Englisch
Libro nella banca dati dal 2009-12-07T21:28:53+01:00 (Rome)
Pagina di dettaglio ultima modifica in 2024-02-11T22:40:49+01:00 (Rome)
ISBN/EAN: 1441909303
ISBN - Stili di scrittura alternativi:
1-4419-0930-3, 978-1-4419-0930-5
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : sunil, garg
Titolo del libro: circuits, error design, vlsi, design and analysis, circuit analysis, garg, process design
Dati dell'editore
Autore: Rajesh Garg
Titolo: Analysis and Design of Resilient VLSI Circuits - Mitigating Soft Errors and Process Variations
Editore: Springer; Springer US
212 Pagine
Anno di pubblicazione: 2009-11-16
New York; NY; US
Stampato / Fatto in
Lingua: Inglese
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXII, 212 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Crosstalk; EDA; Power Supply Variation; Radiation Effects; Resilient VLSI Design; Soft Errors; VLSI; VLSI Design; algorithms; circuit design; design automation; electronic design automation; modeling; simulation; stability; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers Includes supplementary material: sn.pub/extras
Altri libri che potrebbero essere simili a questo:
Ultimo libro simile:
9781489985101 Analysis and Design of Resilient VLSI Circuits (Garg, Rajesh)
< Per archiviare...