Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45) - edizione con copertina flessibile
2010, ISBN: 9783642083723
Editor: Hawkes, P.W. Springer, Paperback, Auflage: Softcover reprint of the original 2nd ed. 1998, 543 Seiten, Publiziert: 2010-12-01T00:00:01Z, Produktgruppe: Book, Hersteller-Nr.: biogr… Altro …
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Scanning Electron Microscopy Physics of Image Formation and Microanalysis - edizione con copertina flessibile
2010, ISBN: 3642083722
Softcover reprint of the original 2nd ed. 1998 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Rasterelektronenmikroskopie; scanningtunnelingcrystal; diffract… Altro …
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Scanning Electron Microscopy ab 192.49 € als Taschenbuch: Physics of Image Formation and Microanalysis. Softcover reprint of the original 2nd ed. 1998. Aus dem Bereich: Bücher, Wissenscha… Altro …
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) [Soft Cover ] - edizione con copertina flessibile
2010, ISBN: 3642083722
[EAN: 9783642083723], Neubuch, [PU: Springer], Books
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis - edizione con copertina flessibile
2010, ISBN: 3642083722
[EAN: 9783642083723], Gebraucht, wie neu, [PU: Springer], Unread book in perfect condition., Books
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45) - edizione con copertina flessibile
2010, ISBN: 9783642083723
Editor: Hawkes, P.W. Springer, Paperback, Auflage: Softcover reprint of the original 2nd ed. 1998, 543 Seiten, Publiziert: 2010-12-01T00:00:01Z, Produktgruppe: Book, Hersteller-Nr.: biogr… Altro …
Reimer, Ludwig:
Scanning Electron Microscopy Physics of Image Formation and Microanalysis - edizione con copertina flessibile2010, ISBN: 3642083722
Softcover reprint of the original 2nd ed. 1998 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Rasterelektronenmikroskopie; scanningtunnelingcrystal; diffract… Altro …
ISBN: 9783642083723
Scanning Electron Microscopy ab 192.49 € als Taschenbuch: Physics of Image Formation and Microanalysis. Softcover reprint of the original 2nd ed. 1998. Aus dem Bereich: Bücher, Wissenscha… Altro …
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) [Soft Cover ] - edizione con copertina flessibile
2010, ISBN: 3642083722
[EAN: 9783642083723], Neubuch, [PU: Springer], Books
Scanning Electron Microscopy : Physics of Image Formation and Microanalysis - edizione con copertina flessibile
2010, ISBN: 3642083722
[EAN: 9783642083723], Gebraucht, wie neu, [PU: Springer], Unread book in perfect condition., Books
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Informazioni dettagliate del libro - Scanning Electron Microscopy
EAN (ISBN-13): 9783642083723
ISBN (ISBN-10): 3642083722
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2010
Editore: Springer Berlin Heidelberg
Libro nella banca dati dal 2011-08-01T18:50:49+02:00 (Rome)
Pagina di dettaglio ultima modifica in 2024-01-11T21:31:36+01:00 (Rome)
ISBN/EAN: 9783642083723
ISBN - Stili di scrittura alternativi:
3-642-08372-2, 978-3-642-08372-3
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : ludwig reimer, hawkes, ludwig reimers
Titolo del libro: optical microscopy, science microscopy, scanning electron microscopy physics image formation and microanalysis, ludwig
Dati dell'editore
Autore: Ludwig Reimer
Titolo: Springer Series in Optical Sciences; Scanning Electron Microscopy - Physics of Image Formation and Microanalysis
Editore: Springer; Springer Berlin
529 Pagine
Anno di pubblicazione: 2010-12-01
Berlin; Heidelberg; DE
Stampato / Fatto in
Lingua: Inglese
329,99 € (DE)
BC; Hardcover, Softcover / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Rasterelektronen Mikroskopie; Scanning Tunneling Microscopy; crystal; diffraction; electron microscope; electron microscopy; electron optics; microscopy; optics; scanning electron microscope; Spectroscopy; Condensed Matter Physics; Surface and Interface and Thin Film; Physics and Astronomy; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Mathematik und Naturwissenschaften; BB; BB; EA
provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.Altri libri che potrebbero essere simili a questo:
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