Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - copertina rigida, flessible
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Altro …
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Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - copertina rigida, flessible
2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - copertina rigida, flessible
2012, ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - copertina rigida, flessible
2012, ISBN: 3642273807
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Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - copertina rigida, flessible
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Biblio.co.uk |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - copertina rigida, flessible
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Altro …
Hofmann, Siegfried:
Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - copertina rigida, flessible2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - copertina rigida, flessible
2012
ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - copertina rigida, flessible
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - copertina rigida, flessible
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Informazioni dettagliate del libro - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49)
EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Copertina rigida
Anno di pubblicazione: 2012
Editore: Springer
528 Pagine
Peso: 0,939 kg
Lingua: Englisch
Libro nella banca dati dal 2007-06-19T21:28:18+02:00 (Rome)
Pagina di dettaglio ultima modifica in 2023-08-09T18:04:24+02:00 (Rome)
ISBN/EAN: 9783642273803
ISBN - Stili di scrittura alternativi:
3-642-27380-7, 978-3-642-27380-3
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : hofman, siegfried hofmann, hofmann else, siegfried springer
Titolo del libro: before science, material sciences, materials sciences, surface science series, user guide, ray spectroscopy
Dati dell'editore
Autore: Siegfried Hofmann
Titolo: Springer Series in Surface Sciences; Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide
Editore: Springer; Springer Berlin
528 Pagine
Anno di pubblicazione: 2012-10-25
Berlin; Heidelberg; DE
Stampato / Fatto in
Lingua: Inglese
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XX, 528 p.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Auger electron spectroscopy; interface analysis; scanning Auger microscopy; surface analysis; thin-film depth profiling; Condensed Matter Physics; Spectroscopy; Surfaces, Interfaces and Thin Film; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; BC
Outline of the Technique/Brief Description.- Theoretical Background.- Instrumentation.- Practical Surface Analysis with AES.- Data Evaluation/Quantification.- Problem Solving with AES (Examples).This is the most comprehensive book available on this widely used analytical technique Includes supplementary material: sn.pub/extras
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