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Advanced Test Methods for SRAMs - Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel
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Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel:

Advanced Test Methods for SRAMs - nuovo libro

ISBN: 9781441909381

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the tec… Altro …

Nr. A1031452127. Costi di spedizione:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.43)
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Advanced Test Methods for SRAMs - Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
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Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:

Advanced Test Methods for SRAMs - nuovo libro

2009, ISBN: 9781441909381

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, eBooks, eBook Download (PDF), 2010, Modern electronics depend on nanoscaled technologies that present new chall… Altro …

Costi di spedizione:Does not ship to your country., Costi di spedizione aggiuntivi
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Advanced Test Methods for SRAMs - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - nuovo libro

ISBN: 1441909389

Advanced Test Methods for SRAMs ab 106.99 € als pdf eBook: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Comp… Altro …

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ISBN: 9781441909381

A digital copy of "Advanced Test Methods For Srams" by Bosio. Download is immediately available upon purchase! 9781441909381,1441909389,advanced,test,methods,srams,bosio eBook, Vitalsour… Altro …

Download INSTANTLY! Format: VitalSource. Type: . Copying: Allowed, .2Â.36 selections may be copied daily for 2Â.365 days. Printable: Allowed, .2Â.36 prints daily for 2Â.365 days. Expires: No Expiration. Read Aloud?: Allowed. Sharing: Not Allowed. Software: Online: No additional software required <br> Offline: VitalSource Bookshelf. Shipping to USA only! Textbooks. Costi di spedizione: EUR 0.00
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Advanced Test Methods for SRAMs - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - nuovo libro

ISBN: 9781441909381

*Advanced Test Methods for SRAMs* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / pdf eBook für 96.49 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Co… Altro …

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Advanced Test Methods for SRAMs
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1441909389

Informazioni dettagliate del libro - Advanced Test Methods for SRAMs


EAN (ISBN-13): 9781441909381
ISBN (ISBN-10): 1441909389
Anno di pubblicazione: 2009
Editore: Springer US
171 Pagine
Lingua: eng/Englisch

Libro nella banca dati dal 2010-02-23T18:29:29+01:00 (Rome)
Pagina di dettaglio ultima modifica in 2023-08-11T08:36:07+02:00 (Rome)
ISBN/EAN: 1441909389

ISBN - Stili di scrittura alternativi:
1-4419-0938-9, 978-1-4419-0938-1
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : serge, bosio, girard patrick, arnaud
Titolo del libro: test, advanced method, sram

Dati dell'editore

Autore: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Titolo: Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Editore: Springer; Springer US
171 Pagine
Anno di pubblicazione: 2009-10-08
New York; NY; US
Lingua: Inglese
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
XV, 171 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testing; Technologie; currmssc; design; diagnosis; electronics; semiconductor; technology; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BC

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras
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