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In-situ Materials Characterization - Herausgegeben:Graafsma, Heinz; Ziegler, Alexander; Frenken, Joost W.M.; Zhang, Xiao Feng
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Herausgegeben:Graafsma, Heinz; Ziegler, Alexander; Frenken, Joost W.M.; Zhang, Xiao Feng:

In-situ Materials Characterization - edizione con copertina flessibile

2016, ISBN: 9783662519769

[ED: Softcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], The behavior of nanoscale materials can change rapidly with time either because the environment changes ra… Altro …

Costi di spedizione:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) buecher.de GmbH & Co. KG
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In-situ Materials Characterization : Across Spatial and Temporal Scales - Alexander Ziegler
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Alexander Ziegler:

In-situ Materials Characterization : Across Spatial and Temporal Scales - edizione con copertina flessibile

2016, ISBN: 3662519763

[EAN: 9783662519769], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], IN-SITUCHARACTERIZATION; MATERIALDYNAMICS; NANOANALYSIS; NANOSCALEMATERIALS; NEUTRONSCATTERING; PHOTOELECTRONSP… Altro …

NEW BOOK. Costi di spedizione:Versandkostenfrei. (EUR 0.00) AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)]
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In-situ Materials Characterization - Alexander Ziegler
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Alexander Ziegler:
In-situ Materials Characterization - edizione con copertina flessibile

2023

ISBN: 9783662519769

[ED: Taschenbuch], [PU: Springer Berlin Heidelberg], Neuware - The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because t… Altro …

Costi di spedizione:Versand nach Deutschland. (EUR 2.40) AHA-BUCH GmbH
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In-situ Materials Characterization - Ziegler, Alexander Graafsma, Heinz Zhang, Xiao Feng Frenken, Joost W.M.
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Ziegler, Alexander Graafsma, Heinz Zhang, Xiao Feng Frenken, Joost W.M.:
In-situ Materials Characterization - Prima edizione

2016, ISBN: 9783662519769

edizione con copertina flessibile

[ED: Kartoniert / Broschiert], [PU: Springer Berlin Heidelberg], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scientific status report … Altro …

Costi di spedizione:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Moluna GmbH
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Ziegler, Alexander (Editor)/ Graafsma, Heinz (Editor)/ Zhang, Xiao Feng (Editor)/ Frenken, Joost W. M. (Editor):
In-situ Materials Characterization: Across Spatial and Temporal Scales - edizione con copertina flessibile

2016, ISBN: 9783662519769

Springer Verlag, 2016. Paperback. New. reprint edition. 268 pages. 9.25x6.10x0.63 inches., Springer Verlag, 2016, 6

Costi di spedizione: EUR 11.74 Revaluation Books

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Informazioni dettagliate del libro - In-situ Materials Characterization


EAN (ISBN-13): 9783662519769
ISBN (ISBN-10): 3662519763
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2016
Editore: Springer Berlin

Libro nella banca dati dal 2016-09-10T14:43:34+02:00 (Rome)
Pagina di dettaglio ultima modifica in 2024-03-22T20:59:29+01:00 (Rome)
ISBN/EAN: 9783662519769

ISBN - Stili di scrittura alternativi:
3-662-51976-3, 978-3-662-51976-9
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : alexander ziegler, graaf, zhang xiao, zhang feng, joost, alexander heinz
Titolo del libro: characterization materials, scales, situ


Dati dell'editore

Autore: Alexander Ziegler; Heinz Graafsma; Xiao Feng Zhang; Joost W.M. Frenken
Titolo: Springer Series in Materials Science; In-situ Materials Characterization - Across Spatial and Temporal Scales
Editore: Springer; Springer Berlin
256 Pagine
Anno di pubblicazione: 2016-08-23
Berlin; Heidelberg; DE
Stampato / Fatto in
Lingua: Inglese
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XI, 256 p. 124 illus., 78 illus. in color.

BC; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; In-situ characterization; Material dynamics; Nanoanalysis; Nanoscale materials; Neutron scattering; Photoelectron spectroscopy; Scanning probe techniques; Structure-property; Ultra-fast analysis; X-ray absorption spectroscopy; Nanophysics; Characterization and Analytical Technique; Spectroscopy; Surfaces, Interfaces and Thin Film; Nanotechnology; Structural Materials; Nanowissenschaften; Werkstoffprüfung; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; Nanotechnologie; BB

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.
Scientific status report on analytical techniques in nano-and surface sciences Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering Includes supplementary material: sn.pub/extras

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