Integrated Analog-To-Digital and Digital-To-Analog Converters (The Springer International Series in Engineering and Computer Science) (The Springer ... and Computer Science, 264, Band 264) - edizione con copertina flessibile

EAN (ISBN-13): 9781461361862
ISBN (ISBN-10): 1461361869
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2012
Editore: Springer

Libro nella banca dati dal 2013-12-20T02:44:43+01:00 (Rome)
Pagina di dettaglio ultima modifica in 2024-01-26T15:46:46+01:00 (Rome)
ISBN/EAN: 9781461361862

ISBN - Stili di scrittura alternativi:
1-4613-6186-9, 978-1-4613-6186-2
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : rudy, plass, plas
Titolo del libro: analog digital, think analog, analog computer, analog integrated

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Dati dell'editore

Autore: Rudy J. van de Plassche
Titolo: The Springer International Series in Engineering and Computer Science; Integrated Analog-To-Digital and Digital-To-Analog Converters
Editore: Springer; Springer US
501 Pagine
Anno di pubblicazione: 2012-11-05
New York; NY; US
Stampato / Fatto in
Lingua: Inglese
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XLIV, 501 p.

BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Transducer; analog; circuit; coding; design; signal; signal processing; testing; Electronic Circuits and Systems; Electrical and Electronic Engineering; Signal, Speech and Image Processing; Elektrotechnik; Elektronik; Digitale Signalverarbeitung (DSP); BB; EA

1 The converter as a black box.- 1.1 Introduction.- 1.2 Basic D/A and A/D converter function.- 1.3 Classification of signals.- 1.4 Sampling time uncertainty.- 1.5 Sampling clock time uncertainty.- 1.6 Quantization errors.- 1.7 Oversampling of converters.- 1.8 Quantizer model.- 1.9 Filtering.- 1.10 Minimum required stop band attenuation.- 1.11 Conclusion.- 2 Specifications of converters.- 2.1 Introduction.- 2.2 Digital data coding.- 2.3 Digital coding schemes.- 2.4 DC specifications.- 2.5 Dynamic specifications.- 2.6 Conclusion.- 3 Testing of D/A and A/D converters.- 3.1 Introduction.- 3.2 DC testing of D/A converters.- 3.3 Dynamic testing of D/A converters.- 3.4 DC testing of A/D converters.- 3.5 Dynamic testing of A/D converters.- 3.6 Bit Error Rate.- 3.7 Testing very high-speed A/D converters.- 3.8 Beat frequency test configuration.- 3.9 Code density DNL and INL measurement.- 3.10 Testing of sample-and-hold amplifiers.- 3.11 Cascading sample-and-hold amplifiers.- 3.12 Conclusion.- 4High-speed A/D converters.- 4.1 Introduction.- 4.2 Design problems in high-speed converters.- 4.3 Internal converter coding schemes.- 4.4 Full-flash converters.- 4.5 Gray code full flash converters.- 4.6 Circular code flash converters.- 4.7 Two-step flash converters.- 4.8 Multi-step A/D converter.- 4.9 Folding A/D converters.- 4.10 Double folding system.- 4.11 Folding and interpolation systems.- 5 Limitations of comparators.- 5.1 Signal delay in limiting amplifiers.- 5.2 Definition of the delay problem.- 5.3 Delay calculation model.- 5.4 Variable delay calculation.- 5.5 Distortion calculation.- 5.6 Failure analysis of comparators.- 5.7 Input frequency decision moment variation.- 5.8 Conclusion.- 6 High-accuracy D/A converters.- 6.1 Introduction.- 6.2 Pulse-width modulation D/A converters.- 6.3 Integrating D/A converters.- 6.4 Current weighting using ladder networks.- 6.5 Monotonic by design network systems.- 6.6 Self calibrating D/A converter system.- 6.7 Dynamic Element Matching.- 6.8Current calibration principle.- 6.9 Conclusion.- 7 High-accuracy A/D converters.- 7.1 Introduction.- 7.2 Single slope A/D converter system.- 7.3 Dual-slope A/D converter system.- 7.4 Dual-ramp single-slope A/D converter system.- 7.5 Successive approximation converter system.- 7.6 Algorithmic A/D converter.- 7.7 Cyclic Redundant Signed Digit A/D converter.- 7.8 Self-calibrating capacitor A/D converter.- 7.9 Conclusion.- 8 Sample-and-hold amplifiers.- 8.1 Introduction.- 8.2 Basic sample-and-hold configuration.- 8.3 Generalized non-inverting configurations.- 8.4 Generalized inverting configurations.- 8.5 Differential sample-and-hold configurations.- 8.6 Bipolar inverting mode S/H example.- 8.7 Conclusion.- 9 Voltage and current reference sources.- 9.1 Introduction.- 9.2 Zener diode reference voltage.- 9.3 Base-emitter voltage used as a reference.- 9.4 All-NPN band-gap voltage reference source.- 9.5 General purpose current stabilizer.- 9.6 Basic band-gap reference voltage source.- 9.7 Band-gap reference current source.- 9.8 Noise of a band-gap reference current source.- 9.9 Conclusion.- 10 Noise-shaping coding.- 10.1 Introduction.- 10.2 Digital oversampling filtering.- 10.3 Noise-shaping coders.- 10.4 Multi-bit largely oversampled noise-shaper.- 10.5 Stability analysis of noise-shapers.- 10.6 Practical noise-shaping D/A converters.- 10.7 Multi-bit noise-shaping D/A converter.- 10.8 Conclusion.- 11 Sigma-delta converters.- 11.1 Introduction.- 11.2 General form of Sigma-delta A/D converters.- 11.3 First-order A/D converter.- 11.4 Second-order A/D converter.- 11.5 Third-order A/D converter.- 11.6 Multi-stage sigma-delta converter (MASH).- 11.7 Feed-forward A/D converter system.- 11.8 Nth-order sigma-delta architecture.- 11.9 Idle pattern.- 11.10 Sigma-delta digital voltmeter.- 11.11 Conclusion.- Problems 453.- Bibliography 465.